We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for ICPMS analysis device.
ipros is IPROS GMS ・ IPROS One of the largest technical database sites in Japan that collects information on.

ICPMS analysis device Product List and Ranking from 5 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated: Aggregation Period:Sep 02, 2026~Sep 29, 2026
This ranking is based on the number of page views on our site.

ICPMS analysis device Manufacturer, Suppliers and Company Rankings

Last Updated: Aggregation Period:Sep 02, 2026~Sep 29, 2026
This ranking is based on the number of page views on our site.

  1. サーモフィッシャーサイエンティフィック株式会社/Thermo Fisher Scientific K.K. Tokyo//Testing, Analysis and Measurement
  2. アジレント・テクノロジー株式会社 Tokyo//Testing, Analysis and Measurement
  3. 一般財団法人材料科学技術振興財団 MST Tokyo//Testing, Analysis and Measurement
  4. 東レリサーチセンター Tokyo//Service Industry
  5. 5 Kyoritsu Electric Corporation Shizuoka//Industrial Electrical Equipment

ICPMS analysis device Product ranking

Last Updated: Aggregation Period:Sep 02, 2026~Sep 29, 2026
This ranking is based on the number of page views on our site.

  1. Laser Ablation ICP-MS System サーモフィッシャーサイエンティフィック株式会社/Thermo Fisher Scientific K.K.
  2. Watch past semiconductor webinar videos and download materials! アジレント・テクノロジー株式会社
  3. [Analysis Case] Rietveld Analysis of Secondary Battery Cathode Materials 一般財団法人材料科学技術振興財団 MST
  4. 4 [Analysis Case] Composition and Impurity Analysis of CIGS Powder 一般財団法人材料科学技術振興財団 MST
  5. 4 Analysis case: Metal content analysis in a solution 一般財団法人材料科学技術振興財団 MST

ICPMS analysis device Product List

1~7 item / All 7 items

Displayed results

[Analysis Case] Composition and Impurity Analysis of CIGS Powder

Quantitative analysis of main components and trace components is possible.

In the development aimed at achieving flexibility and cost reduction for CIGS thin-film solar cells, low-temperature formation processes for the light-absorbing layer and non-vacuum processes are required, making the optimization of the film formation method for CIGS composition and the control of metal contamination levels crucial. This time, we will introduce a case where the composition and impurity concentration of the raw CIGS powder were evaluated with high precision using ICP-MS.

  • Contract Analysis
  • ICPMS analysis device

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Analysis case: Metal content analysis in a solution

High-sensitivity analysis of various solutions, such as pure water and wafer cleaning liquids, is possible.

ICP-MS can sensitively analyze the metal content in solutions, such as the metal amounts in the cleaning solution used in the wafer cleaning process and the metal amounts in the pure water flowing through the pipes installed in the equipment and buildings. It can accommodate various types of solutions, including pure water, acids, and alkalis, and can analyze metal element concentrations ranging from ppt levels to major component levels. This document presents case studies investigating the metal content in commercially available solutions.

  • Contract Analysis
  • Wafer
  • Water quality testing
  • ICPMS analysis device

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

[Analysis Case] Rietveld Analysis of Secondary Battery Cathode Materials

Quantitative analysis of positive electrode active materials, precise evaluation of crystal structure.

In lithium-ion secondary batteries, Li(NiCoMn)O2 (NCM) used as the positive electrode can achieve higher capacity by increasing the Ni ratio, and it also excels in high-temperature storage, making it suitable for mass production for automotive applications. On the other hand, cation mixing, where Ni ions occupy Li sites, is considered one of the factors contributing to the degradation of secondary batteries. This presentation will introduce a case where the metal content of the positive electrode active material was evaluated using ICP-MS, the crystal structure was assessed using XRD, and the results were used to perform Rietveld analysis to evaluate the proportion of cation mixing.

  • Contract Analysis
  • Contract measurement
  • ICPMS analysis device

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Agilent 7850 ICP-MS

Achieve an efficient workflow! Productivity increases, and the reliability of analysis results improves.

The "Agilent 7850 ICP-MS" can detect a wide dynamic range from trace levels to high concentrations. It allows for easy setup of conditions for high matrix samples and complex applications. This not only smooths daily operations but also improves productivity and enhances the reliability of analytical results. Additionally, the ICP-MS MassHunter software is optimized for routine workflows, enabling quick mastery of new equipment. 【Features】 ■ Smartly reduce time wastage in ICP-MS analysis ■ Quickly learn new equipment ■ User-friendly, simple interface ■ Reduce the effort of method development and documentation ■ Simplify sample pretreatment *For more details, please refer to the PDF materials or feel free to contact us.

  • Analytical Equipment and Devices
  • ICPMS analysis device

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Technical Information Magazine 202401-02 Analysis of Metal Particles in Photoresist

This paper introduces the principle of sspICP-MS and presents a case study on the measurement of metal particles in photoresist.

The technical information magazine The TRC News provides the latest information on analytical techniques that are useful for research and development, solving production troubles, and quality control. **Abstract** Single Particle ICP-MS (hereafter spICP-MS) is a method that utilizes the high sensitivity and elemental selectivity of ICP-MS to detect tiny and trace particles containing specific metals, allowing for the acquisition of their concentration and particle size distribution. This article introduces the principles of spICP-MS and presents a case study measuring metal particles in photoresist. **Table of Contents** 1. Introduction 2. Principles and Features of spICP-MS 3. Direct Introduction Method for Organic Solvents 4. Analysis of Al, Fe, and Cu Particles in Photoresist 5. Conclusion

  • Contract Analysis
  • Contract measurement
  • Technical and Reference Books
  • ICPMS analysis device

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Laser Ablation ICP-MS System

Direct qualitative, quantitative, and imaging analysis of elements down to trace amounts in solid samples.

The laser ablation (LA) system equipped with a high repetition frequency laser and a galvanometric optical system, connected to the robust Thermo Scientific iCAP MX series ICP-MS, enables the acceleration, high precision, and expansion of elemental analysis capabilities. ■ Simplification and acceleration of elemental analysis - Solid sample surfaces are sampled using laser irradiation and analyzed directly with ICP-MS. - Complicated operations such as cleaning of instruments for traditional solution pre-treatment, and management of reagents and waste are no longer necessary, reducing costs, workload, and environmental impact. ■ Achieving sensitivity and precision equal to or greater than solution ICP-MS - Elimination of weighing errors and contamination during traditional pre-treatment, as well as interferences caused by acids or solvents during measurement, enhances precision. - High sensitivity is achieved through rapid ablation. - Flexible and highly precise quantification methods can be applied, allowing for quantitative analysis even without standard samples of the same material as the sample. ■ Expansion of ICP-MS analytical capabilities - Analysis of a wide range of samples, including difficult-to-dissolve samples, powder samples, and non-conductive samples, is possible. - Wide-area 2D/3D elemental imaging is achievable, covering areas of several square centimeters and depths of several hundred micrometers. - Accurate analysis is possible through imaging based on quantitative concentrations.

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Watch past semiconductor webinar videos and download materials!

Please take a look at the latest case studies and analytical know-how utilizing Agilent's technology.

Agilent's cutting-edge semiconductor and electronics analysis solutions You can view videos and download materials from past semiconductor webinars. Please take a look at the latest technology use cases and analysis know-how. <Please access the "Related Links" below for viewing and downloads!!> ============= Webinar Videos Recent needs for trace metal impurity analysis in the semiconductor field Fundamentals for lowering DL and BEC of ICP-MS to the extreme Current status and challenges of trace Si analysis using ICP-MS Data integrity compliance and operational efficiency utilizing data management systems GC/MS solutions for the semiconductor industry Latest information on PFAS analysis in materials using LC/MS Introduction to Agilent's elemental analysis instrument portfolio ============= PDF Materials OpenLab ECM XT addresses the challenges of "analytical work efficiency," "accuracy management," and "data tampering" in material analysis Tips for ICP-MS analysis that material manufacturers should know

  • Analytical Equipment and Devices
  • Spectroscopic Analysis Equipment
  • ICPMS analysis device

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration